P2808B0 Datasheet – MOSFET, SMD 8Pin, POWER Controller

Part Number: P2808B0, P2808BO

Function: POWER Controller IC for NoteBook

Package: SOP8 Type

Image:
p2808b0-power-controller
P2808 datasheet
P2808BO pinout and schematic

p2808b0-datasheet-pinout

Pin arrangement

1. VA
2. VIN
3. M_BTN#
4. INSTANT-ON
5. GND
6. PWR_SW#
7. DD_ON_LATCH
8. VIN1

 

Reference site :

1. http://notebook1.ru/

2. Burnt out a component in my laptop, but can’t identify it.

http://www.neogaf.com/forum/showthread.php?t=913723&page=1

 

P2808B0 Datasheet ( Service Manual )

P2808B0 pdf

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K2699 Datasheet PDF – 600V, 12A, MOSFET – Toshiba

This is one of the types of MOSFETs and is a kind of transistor.

Part Number: K2699, 2SK2699

Function: 600V, 12A, Silicon N Channel MOSFET

Package: TO-3P type

Manufacturer: Toshiba

Image :

K2699 datasheet

 

Description

This is Silicon N Channel MOS Type FET.

Features

1. Low drain−source ON resistance : RDS (ON)= 0.5 Ω(typ.),
2. High forward transfer admittance : |Yfs| = 11 S (typ.),
3. Low leakage current : IDSS= 100 μA (max) (VDS= 600 V),
4. Enhancement mode : Vth= 2.0 to 4.0 V (VDS= 10 V, ID= 1 mA)

Pinout

K2699 pinout transistor

Applications:

1. Chopper Regulator

2. DC-DC Converter and Motor Driver

Absolute Maximum Ratings (Ta = 25°C)

1. Drain−source voltage: VDSS = 600 V
2. Drain−gate voltage (RGS = 20 kΩ): VDGR = 600 V
3. Gate−source voltage: VGSS = ±30 V
4. Drain power dissipation (Tc = 25°C): PD = 150 W
5. Single pulse avalanche energy : EAS = 605 mJ
6. Avalanche current : IAR = 12 A
7. Repetitive avalanche energy : EAR = 15 mJ
8. Channel temperature: Tch = 150 °C
9. Storage temperature range : Tstg = -55~150 °C

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

Other data sheets are available within the file: 2SK2699

K2699 Datasheet PDF Download


K2699 pdf